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Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2018, 卷号: 61, 期号: 11, 页码: 17
作者:  Li, Xiaowei;  Yan, Guihai;  Ye, Jing;  Wang, Ying
收藏  |  浏览/下载:69/0  |  提交时间:2019/12/10
fault tolerance  on-chip  self-test  self-diagnosis  self-repair  
PSI Conscious Write Scheduling: Architectural Support for Reliable Power Delivery in 3-D Die-Stacked PCM 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 5, 页码: 1613-1625
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Zhang, Lei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载:53/0  |  提交时间:2019/12/13
3-D integration  IR-drop  phase-change memory (PCM)  through-silicon-via (TSV)  write throughput