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Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2010, 卷号: E93D, 期号: 8, 页码: 2223-2232
作者:  Liu, Jun;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载:47/0  |  提交时间:2019/12/16
selective encoding  test data compression  test power reduction  flexible grouping  X-filling  
Compression/scan co-design for reducing test data volume, scan-in power dissipation, and test application time 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2006, 卷号: E89D, 期号: 10, 页码: 2616-2625
作者:  Hu, Yu;  Han, Yinhe;  Li, Xiaowei;  Li, Huawei;  Wen, Xiaoqing
收藏  |  浏览/下载:45/0  |  提交时间:2019/12/16
compression  run-length coding  random access scan  power dissipation  test application time  
Wrapper scan chains design for rapid and low power testing of embedded cores 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2005, 卷号: E88D, 期号: 9, 页码: 2126-2134
作者:  Han, YH;  Hu, Y;  Li, XW;  Li, HW;  Chandra, A;  Wen, XQ
收藏  |  浏览/下载:45/0  |  提交时间:2019/12/16
SOC testing  wrapper design  scan slices  overlapping