中国科学院计算技术研究所机构知识库

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限定条件	出处：IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	HyCA: A Hybrid Computing Architecture for Fault-Tolerant Deep Learning 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 10, 页码: 3400-3413 作者:  Liu, Cheng;  Chu, Cheng;  Xu, Dawen;  Wang, Ying;  Wang, Qianlong;  Li, Huawei;  Li, Xiaowei;  Cheng, Kwang-Ting 收藏  |  浏览/下载：25/0  |  提交时间：2022/12/07 Circuit faults  Computational modeling  Deep learning  Hardware  Redundancy  Neural networks  Computer architecture  Deep learning accelerator (DLA)  fault detection  fault tolerance  hybrid computing architecture (HyCA)
	A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 12, 页码: 4524-4536 作者:  Cui, Aijiao;  Li, Mengyang;  Qu, Gang;  Li, Huawei 收藏  |  浏览/下载：29/0  |  提交时间：2021/12/01 Ciphers  Encryption  Integrated circuits  Side-channel attacks  Testing  Cryptographic hash function  obfuscation logic  scan design  scan-based side-channel attack
	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui 收藏  |  浏览/下载：50/0  |  提交时间：2020/12/10 Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)
	Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2011, 卷号: 30, 期号: 3, 页码: 455-463 作者:  Wu, Shianling;  Wang, Laung-Terng;  Wen, Xiaoqing;  Jiang, Zhigang;  Tan, Lang;  Zhang, Yu;  Hu, Yu;  Jone, Wen-Ben;  Hsiao, Michael S.;  Li, James Chien-Mo;  Huang, Jiun-Lang;  Yu, Lizhen 收藏  |  浏览/下载：68/0  |  提交时间：2019/12/16 Aligned launch-on-capture  at-speed scan testing  double-capture  hybrid launch-on-capture  launch-on-capture  one-hot launch-on-capture  staggered launch-on-capture