中国科学院计算技术研究所机构知识库

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已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	Coupled Electronic and Anharmonic Structural Dynamics for Carrier Self-Trapping in Photovoltaic Antimony Chalcogenides 期刊论文 ADVANCED SCIENCE, 2022, 页码: 9 作者:  Tao, Weijian;  Zhu, Leilei;  Li, Kanghua;  Chen, Chao;  Chen, Yuzhong;  Li, Yujie;  Li, Xufeng;  Tang, Jiang;  Shang, Honghui;  Zhu, Haiming 收藏  |  浏览/下载：24/0  |  提交时间：2022/12/07 antimony chalcogenides  carrier self-trapping  electron-phonon interaction
	Defect Analysis and Parallel Testing or 3D Hybrid CMOS-Memristor Memory 期刊论文 IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, 2021, 卷号: 9, 期号: 2, 页码: 745-758 作者:  Liu, Peng;  You, Zhiqiang;  Wu, Jigang;  Elimu, Michael;  Wang, Weizheng;  Cai, Shuo;  Han, Yinhe 收藏  |  浏览/下载：33/0  |  提交时间：2021/12/01 Non-volatile memory  RRAM  CMOL  memristor  testing
	A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 12, 页码: 4524-4536 作者:  Cui, Aijiao;  Li, Mengyang;  Qu, Gang;  Li, Huawei 收藏  |  浏览/下载：29/0  |  提交时间：2021/12/01 Ciphers  Encryption  Integrated circuits  Side-channel attacks  Testing  Cryptographic hash function  obfuscation logic  scan design  scan-based side-channel attack
	Automatic Generation of High-Performance FFT Kernels on Arm and X86 CPUs 期刊论文 IEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS, 2020, 卷号: 31, 期号: 8, 页码: 1925-1941 作者:  Li, Zhihao;  Jia, Haipeng;  Zhang, Yunquan;  Chen, Tun;  Yuan, Liang;  Vuduc, Richard 收藏  |  浏览/下载：56/0  |  提交时间：2020/12/10 AutoFFT  FFT  code generation  template  DFT
	Scan chain design for shift power reduction in scan-based testing 期刊论文 SCIENCE CHINA-INFORMATION SCIENCES, 2011, 卷号: 54, 期号: 4, 页码: 767-777 作者:  Li Jia;  Hu Yu;  Li XiaoWei 收藏  |  浏览/下载：66/0  |  提交时间：2019/12/16 low power DfT  scan-based testing  test power reduction  scan chain design
	Design for Testability Features of Godson-3 Multicore Microprocessor 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2011, 卷号: 26, 期号: 2, 页码: 302-313 作者:  Qi, Zi-Chu;  Liu, Hui;  Li, Xiang-Ku;  Hu, Wei-Wu 收藏  |  浏览/下载：65/0  |  提交时间：2019/12/16 DFT (design for testability)  TAM (test access mechanism)  multicore processor  low power test
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei 收藏  |  浏览/下载：41/0  |  提交时间：2019/12/16 microprocessor design-for-testability  test generation  built-in self-test  at-speed testing