中国科学院计算技术研究所机构知识库

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	Soft Error Reliability Analysis of Vision Transformers 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 页码: 11 作者:  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Yang, Bing;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：6/0  |  提交时间：2023/12/04 ABFT  fault-tolerance  soft errors  vision transformers (ViTs)  vulnerability analysis
	Accelerating Deformable Convolution Networks with Dynamic and Irregular Memory Accesses 期刊论文 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2023, 卷号: 28, 期号: 4, 页码: 23 作者:  Chu, Cheng;  Liu, Cheng;  Xu, Dawen;  Wang, Ying;  Luo, Tao;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：6/0  |  提交时间：2023/12/04 Deformable convolution network  neural network accelerator  irregular memory access  runtime tile scheduling
	Network Pruning for Bit-Serial Accelerators 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1597-1609 作者:  Zhao, Xiandong;  Wang, Ying;  Liu, Cheng;  Shi, Cong;  Tu, Kaijie;  Zhang, Lei 收藏  |  浏览/下载：6/0  |  提交时间：2023/12/04 AI accelerators  neural networks (NNs)  NN compression
	HyCA: A Hybrid Computing Architecture for Fault-Tolerant Deep Learning 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 10, 页码: 3400-3413 作者:  Liu, Cheng;  Chu, Cheng;  Xu, Dawen;  Wang, Ying;  Wang, Qianlong;  Li, Huawei;  Li, Xiaowei;  Cheng, Kwang-Ting 收藏  |  浏览/下载：22/0  |  提交时间：2022/12/07 Circuit faults  Computational modeling  Deep learning  Hardware  Redundancy  Neural networks  Computer architecture  Deep learning accelerator (DLA)  fault detection  fault tolerance  hybrid computing architecture (HyCA)
	Taming Process Variations in CNFET for Efficient Last-Level Cache Design 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2022, 卷号: 30, 期号: 4, 页码: 418-431 作者:  Xu, Dawen;  Feng, Zhuangyu;  Liu, Cheng;  Li, Li;  Wang, Ying;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：23/0  |  提交时间：2022/12/07 CNTFETs  Delays  Transistors  Layout  Very large scale integration  Radio frequency  Energy consumption  nanotube field-effect transistor (CNFET)  last-level cache (LLC)  process variation (PV)  variation-aware cache