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Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2016, 卷号: 35, 期号: 6, 页码: 999-1011
作者:  Zhou, Yanhong;  Wang, Tiancheng;  Li, Huawei;  Lv, Tao;  Li, Xiaowei
收藏  |  浏览/下载:65/0  |  提交时间:2019/12/13
Abstraction-guided simulation  functional test generation  hard-to-reach states  path constraint solving  
Abstraction-Guided Simulation Using Markov Analysis for Functional Verification 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2016, 卷号: 35, 期号: 2, 页码: 285-297
作者:  Wang, Jian;  Li, Huawei;  Lv, Tao;  Wang, Tiancheng;  Li, Xiaowei;  Kundu, Sandip
收藏  |  浏览/下载:40/0  |  提交时间:2019/12/13
Abstraction-guided simulation  Markov analysis  semi-formal verification  
Path Delay Test Generation Toward Activation of Worst Case Coupling Effects 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982
作者:  Zhang, Minjin;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:73/0  |  提交时间:2019/12/16
Crosstalk-induced delay  delay testing  path delay fault  signal integrity  test generation  timing analysis