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Statistical Modeling of Soft Error Influence on Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 11, 页码: 4152-4163
作者:  Huang, Haitong;  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Luo, Tao;  Cheng, Long;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Fault analysis  fault simulation  neural network (NN) reliability  statistical fault modeling  
Accelerating Deformable Convolution Networks with Dynamic and Irregular Memory Accesses 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2023, 卷号: 28, 期号: 4, 页码: 23
作者:  Chu, Cheng;  Liu, Cheng;  Xu, Dawen;  Wang, Ying;  Luo, Tao;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：7/0  |  提交时间：2023/12/04
Deformable convolution network  neural network accelerator  irregular memory access  runtime tile scheduling  
DOE: database offloading engine for accelerating SQL processing 期刊论文
DISTRIBUTED AND PARALLEL DATABASES, 2023, 页码: 25
作者:  Kong, Hao;  Lu, Wenyan;  Chen, Yan;  Wu, Jingya;  Zhang, Yu;  Yan, Guihai;  Li, Xiaowei
收藏  |  浏览/下载：8/0  |  提交时间：2023/12/04
Database  Hardware  software co-design  Heterogeneous system  Analytic query processing  
Scalable and Conflict-Free NTT Hardware Accelerator Design: Methodology, Proof, and Implementation 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1504-1517
作者:  Mu, Jianan;  Ren, Yi;  Wang, Wen;  Hu, Yizhong;  Chen, Shuai;  Chang, Chip-Hong;  Fan, Junfeng;  Ye, Jing;  Cao, Yuan;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：9/0  |  提交时间：2023/12/04
Memory access pattern  number theoretic transform (NTT)  post-quantum cryptography (PQC)  scalable hardware design  
On-Line Fault Protection for ReRAM-Based Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2023, 卷号: 72, 期号: 2, 页码: 423-437
作者:  Li, Wen;  Wang, Ying;  Liu, Cheng;  He, Yintao;  Liu, Lian;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：14/0  |  提交时间：2023/07/12
Training  Fault detection  Computational modeling  Image edge detection  Memristors  Neural networks  Kernel  Deep neural network  hard fault  ReRAM  reliability  soft fault