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Capture-power-aware test data compression using selective encoding 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 205-216
作者:  Li, Jia;  Liu, Xiao;  Zhang, Yubin;  Hu, Yu;  Li, Xiaowei;  Xu, Qiang
收藏  |  浏览/下载:69/0  |  提交时间:2019/12/16
Test compression  Low-power testing  Scan-based testing  
Scan chain design for shift power reduction in scan-based testing 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2011, 卷号: 54, 期号: 4, 页码: 767-777
作者:  Li Jia;  Hu Yu;  Li XiaoWei
收藏  |  浏览/下载:66/0  |  提交时间:2019/12/16
low power DfT  scan-based testing  test power reduction  scan chain design  
X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092
作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei
收藏  |  浏览/下载:38/0  |  提交时间:2019/12/16
At-speed scan-based testing  low-power testing  X-filling