中国科学院计算技术研究所机构知识库

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限定条件	出处：IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	An Adaptive Thermal-Aware ECC Scheme for Reliable STT-MRAM LLC Design 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 8, 页码: 1851-1860 作者:  Wu, Bi;  Zhang, Beibei;  Cheng, Yuanqing;  Wang, Ying;  Liu, Dijun;  Zhao, Weisheng 收藏  |  浏览/下载：77/0  |  提交时间：2019/12/10 Error correction code (ECC)  last level cache (LLC)  reliability  spin-transfer-torque magnetoresistive random-access memory (STT-MRAM)  temperature
	VANUCA: Enabling Near-Threshold Voltage Operation in Large-Capacity Cache 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 3, 页码: 858-870 作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：35/0  |  提交时间：2019/12/13 Cache design  fault tolerant  multi-V-dd  near-threshold voltage (NTV)  nonuniform cache access (NUCA)