中国科学院计算技术研究所机构知识库

浏览/检索结果: 共3条，第1-3条

帮助

限定条件	出处：IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	A Novel High Performance and Energy Efficient NUCA Architecture for STT-MRAM LLCs With Thermal Consideration 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 4, 页码: 803-815 作者:  Wu, Bi;  Dai, Pengcheng;  Cheng, Yuanqing;  Wang, Ying;  Yang, Jianlei;  Wang, Zhaohao;  Liu, Dijun;  Zhao, Weisheng 收藏  |  浏览/下载：52/0  |  提交时间：2020/12/10 System-on-chip  Computer architecture  Magnetic tunneling  Transistors  Switches  Thermal sensors  Organizations  Cache  data migration  low power  spin transfer torque magnetic memory (STT-MRAM)  thermal gradient
	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui 收藏  |  浏览/下载：51/0  |  提交时间：2020/12/10 Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)
	Retention-Aware DRAM Assembly and Repair for Future FGR Memories 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2017, 卷号: 36, 期号: 5, 页码: 705-718 作者:  Wang, Ying;  Han, Yin-He;  Wang, Cheng;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：39/0  |  提交时间：2019/12/12 DDR  dynamic random-access memory (DRAM)  memory  refresh