中国科学院计算技术研究所机构知识库

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	Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators 期刊论文 IEEE DESIGN & TEST, 2025, 卷号: 42, 期号: 3, 页码: 66-73 作者:  Li, Wen;  Wang, Ying;  Li, Huawei;  Li, Xiaowei;  Zou, Kaiwei 收藏  |  浏览/下载：40/0  |  提交时间：2025/06/25 Accuracy  Fault tolerant systems  Fault tolerance  Deep learning  Image edge detection  Fault detection  Computational modeling  Training  Reliability  Hafnium  Deep Neural Network  ReRAM  Functional Test  Computing-in-Memory
	Improving DNN Accuracy on MLC PIM via Non-Ideal PIM Device Fine-Tuning 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2025, 卷号: 44, 期号: 6, 页码: 2277-2286 作者:  Lv, Hao;  Zhang, Lei;  Wang, Ying 收藏  |  浏览/下载：4/0  |  提交时间：2025/12/03 Closed box  Accuracy  Computational modeling  Programming  Training  Optimization  Computer architecture  Semiconductor device modeling  Energy efficiency  Artificial neural networks  Black-box  multilevel cell (MLC) resistive random access memory (RRAM)  model fine-tuning  processing-in-memory (PIM)
	Attar: RRAM-based in-memory attention accelerator with software-hardware co-optimization 期刊论文 SCIENCE CHINA-INFORMATION SCIENCES, 2025, 卷号: 68, 期号: 3, 页码: 17 作者:  Li, Bing;  Qi, Ying;  Wang, Ying;  Han, Yinhe 收藏  |  浏览/下载：13/0  |  提交时间：2025/06/25 RRAM  computing-in-memory  attention  pruning  quantization