中国科学院计算技术研究所机构知识库

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已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	FCDM: A Methodology Based on Sensor Pattern Noise Fingerprinting for Fast Confidence Detection to Adversarial Attacks 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 12, 页码: 4791-4804 作者:  Lan, Yazhu;  Nixon, Kent W.;  Guo, Qingli;  Zhang, Guohe;  Xu, Yuanchao;  Li, Hai;  Chen, Yiran 收藏  |  浏览/下载：38/0  |  提交时间：2021/12/01 Perturbation methods  Computational modeling  Data integrity  Detectors  Optimization  Field programmable gate arrays  Hardware  Adversarial attacks  confidence detection  deep neural networks (DNNs)  FPGA-based hardware architecture  sensor pattern noise (SPN)
	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者:  Zhang, Ying;  Chakrabarty, Krishnendu;  Peng, Zebo;  Rezine, Ahmed;  Li, Huawei;  Eles, Petru;  Jiang, Jianhui 收藏  |  浏览/下载：49/0  |  提交时间：2020/12/10 Circuit faults  Built-in self-test  Out of order  Model checking  Integrated circuit modeling  Bounded model checking (BMC)  online testing  out-of-order superscalar processors  software-based self-testing (SBST)