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Response compaction for system-on-a-chip based on advanced convolutional codes 期刊论文
SCIENCE IN CHINA SERIES F-INFORMATION SCIENCES, 2006, 卷号: 49, 期号: 2, 页码: 262-272
作者:  Han, YH;  Li, HW;  Li, XW;  Anshuman, C
收藏  |  浏览/下载:117/0  |  提交时间:2019/12/16
SOC test  response compaction  convolutional code  aliasing  X bits masking  
Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2006, 卷号: 55, 期号: 2, 页码: 389-399
作者:  Han, YH;  Li, XW;  Li, HW;  Chandra, A
收藏  |  浏览/下载:112/0  |  提交时间:2019/12/16
automatic test equipment  convolutional code  diagnosis  error cancellation  masking  unknown bits (X-bits)  
Wrapper scan chains design for rapid and low power testing of embedded cores 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2005, 卷号: E88D, 期号: 9, 页码: 2126-2134
作者:  Han, YH;  Hu, Y;  Li, XW;  Li, HW;  Chandra, A;  Wen, XQ
收藏  |  浏览/下载:102/0  |  提交时间:2019/12/16
SOC testing  wrapper design  scan slices  overlapping  
Test resource partitioning based on efficient response compaction for test time and tester channels reduction 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2005, 卷号: 20, 期号: 2, 页码: 201-209
作者:  Han, YH;  Li, XW;  Li, HW;  Chandra, A
收藏  |  浏览/下载:114/0  |  提交时间:2019/12/16
system-on-a-chip (SoC)  test resource partitioning (TRP)  response compaction  diagnose  error cancellation