Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes

doi:10.1109/TIM.2006.870332

	Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes
	Han, YH ; Li, XW ; Li, HW ; Chandra, A
	2006-04-01
发表期刊	IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN	0018-9456
卷号	55 期号:2 页码:389-399
摘要	Test resources can be embedded on the chip to reduce required external tester channels. In order to obtain the maximal reduction of tester channels, a single-output encoder based on the check matrix of the (n, n-1, m,3) convolutional code is presented. When the five proposed theorems are satisfied, the encoder can avoid two and any odd erroneous bit cancellations, handle one unknown bit (X-bit), and diagnose one erroneous bit. Two types of encoders are proposed to implement the check matrix of the convolutional code. A large number of X-bits can be tolerated by choosing a proper memory size and weight of the check matrix, which can also be obtained by an optimized input assignment algorithm. In order to get the full diagnostic capability, the proposed encoder can be reconfigured into a simple linear-code-based encoder by adding some additional gates. Experimental results show that the proposed encoder has an acceptable level of X-bits tolerance and a low aliasing probability.
关键词	automatic test equipment convolutional code diagnosis error cancellation masking unknown bits (X-bits)
DOI	10.1109/TIM.2006.870332
收录类别	SCI
语种	英语
WOS研究方向	Engineering ; Instruments & Instrumentation
WOS类目	Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS记录号	WOS:000236331500003
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/10457
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Han, YH
作者单位	1.Chinese Acad Sci, Adv Test Technol Lab, Inst Comp Technol, Beijing, Peoples R China 2.Grad Univ, Chinese Acad Sci, Beijing, Peoples R China 3.Synopsys Inc, Mountain View, CA 94043 USA
推荐引用方式 GB/T 7714	Han, YH,Li, XW,Li, HW,et al. Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2006,55(2):389-399.
APA	Han, YH,Li, XW,Li, HW,&Chandra, A.(2006).Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,55(2),389-399.
MLA	Han, YH,et al."Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 55.2(2006):389-399.