中国科学院计算技术研究所机构知识库

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限定条件	作者：Han, Yinhe    第一作者    专题：中国科学院计算技术研究所期刊论文    第一作者的第一单位    第一作者单位    通讯作者单位

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	Re-FeMAT: A Reconfigurable Multifunctional FeFET-Based Memory Architecture 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 11, 页码: 5071-5084 作者:  Zhang, Xiaoyu;  Liu, Rui;  Song, Tao;  Yang, Yuxin;  Han, Yinhe;  Chen, Xiaoming 收藏  |  浏览/下载：13/0  |  提交时间：2023/07/12 Convolutional neural network (CNN)  ferroelectric field-effect transistor (FeFET)  few-shot learning  in-memory processing  ternary content-addressable memory (TCAM)
	STT-RAM Buffer Design for Precision-Tunable General-Purpose Neural Network Accelerator 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 4, 页码: 1285-1296 作者:  Song, Lili;  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Cheng, Yuanqing;  Li, Xiaowei 收藏  |  浏览/下载：70/0  |  提交时间：2019/12/12 Approximate computing  machine learning  neural network  spin toque transfer RAM (STT-RAM)
	Statistical energy optimization on voltage-frequency island based MPSoCs in the presence of process variations 期刊论文 MICROELECTRONICS JOURNAL, 2016, 卷号: 54, 页码: 23-31 作者:  Jin, Song;  Han, Yinhe;  Pei, Songwei 收藏  |  浏览/下载：37/0  |  提交时间：2019/12/13 System energy  Process variation  Voltage-frequency island  Multiprocessor system-on-chip
	A Cost-Effective Energy Optimization Framework of Multicore SoCs Based on Dynamically Reconfigurable Voltage-Frequency Islands 期刊论文 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2016, 卷号: 21, 期号: 2, 页码: 14 作者:  Jin, Song;  Pei, Songwei;  Han, Yinhe;  Li, Huawei 收藏  |  浏览/下载：37/0  |  提交时间：2019/12/13 System energy  dynamic voltage-frequency island  task scheduling  VFI partitioning  multicore system-on-chip  energy
	Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文 INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191 作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：67/0  |  提交时间：2019/12/16 Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing