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Leakage current optimization techniques during test based on don't care bits assignment 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2007, 卷号: 22, 期号: 5, 页码: 673-680
作者:  Wang, Wei;  Hu, Yu;  Han, Yin-He;  Li, Xiao-Wei;  Zhang, You-Sheng
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16
leakage current  don't care bits  minimum leakage vector  leakage power  
Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 卷号: 15, 期号: 5, 页码: 531-540
作者:  Han, Yinhe;  Hu, Yu;  Li, Xiaowei;  Li, Huawei;  Chandra, Anshuman
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16
automatic test equipment (ATE)  Godson processor  MUX network  test stimulus decompression