中文版 | English

在结果中检索

CSpace

浏览/检索结果: 共3条，第1-3条 帮助

限定条件    
已选(0)清除 条数/页：   排序方式：
Enhanced Wear-Rate Leveling for PRAM Lifetime Improvement Considering Process Variation 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 1, 页码: 92-102
作者:  Han, Yinhe;  Dong, Jianbo;  Weng, Kaiheng;  Wang, Ying;  Li, Xiaowei
收藏  |  浏览/下载：42/0  |  提交时间：2019/12/13
Endurance  phase-change random access memory (PRAM)  wear leveling (WL)  
ReviveNet: A Self-Adaptive Architecture for Improving Lifetime Reliability via Localized Timing Adaptation 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2011, 卷号: 60, 期号: 9, 页码: 1219-1232
作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载：64/0  |  提交时间：2019/12/16
Lifetime reliability  self-adaptive  aging sensor  timing adaptation  NBTI  
Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：67/0  |  提交时间：2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing