中国科学院计算技术研究所机构知识库(CSpace): 检索

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	Fault Modeling and Efficient Testing of Memristor-Based Memory 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2021, 卷号: 68, 期号: 11, 页码: 4444-4455 作者: Liu, Peng; You, Zhiqiang; Wu, Jigang; Liu, Bosheng; Han, Yinhe; Chakrabarty, Krishnendu 收藏 \| 浏览/下载：25/0 \| 提交时间：2022/06/21 Electrical defects fault model defect-oriented testing March algorithm non-volatile memory
	Defect Analysis and Parallel Testing or 3D Hybrid CMOS-Memristor Memory 期刊论文 IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, 2021, 卷号: 9, 期号: 2, 页码: 745-758 作者: Liu, Peng; You, Zhiqiang; Wu, Jigang; Elimu, Michael; Wang, Weizheng; Cai, Shuo; Han, Yinhe 收藏 \| 浏览/下载：33/0 \| 提交时间：2021/12/01 Non-volatile memory RRAM CMOL memristor testing
	Enhancing the security of memory in cloud infrastructure through in-phase change memory data randomisation 期刊论文 IET COMPUTERS AND DIGITAL TECHNIQUES, 2021, 页码: 14 作者: Zhou, Xianzhong; Wang, Ying 收藏 \| 浏览/下载：27/0 \| 提交时间：2021/12/01

中国科学院计算技术研究所机构知识库