中国科学院计算技术研究所机构知识库

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限定条件	作者：Han, Yinhe    第一作者    语种：英语    文献类型：期刊论文

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序WOS被引频次升序WOS被引频次降序题名升序题名降序
	STT-RAM Buffer Design for Precision-Tunable General-Purpose Neural Network Accelerator 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 4, 页码: 1285-1296 作者:  Song, Lili;  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Cheng, Yuanqing;  Li, Xiaowei 收藏  |  浏览/下载：70/0  |  提交时间：2019/12/12 Approximate computing  machine learning  neural network  spin toque transfer RAM (STT-RAM)
	VANUCA: Enabling Near-Threshold Voltage Operation in Large-Capacity Cache 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 3, 页码: 858-870 作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei 收藏  |  浏览/下载：35/0  |  提交时间：2019/12/13 Cache design  fault tolerant  multi-V-dd  near-threshold voltage (NTV)  nonuniform cache access (NUCA)
	Enhanced Wear-Rate Leveling for PRAM Lifetime Improvement Considering Process Variation 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 1, 页码: 92-102 作者:  Han, Yinhe;  Dong, Jianbo;  Weng, Kaiheng;  Wang, Ying;  Li, Xiaowei 收藏  |  浏览/下载：42/0  |  提交时间：2019/12/13 Endurance  phase-change random access memory (PRAM)  wear leveling (WL)
	Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 卷号: 15, 期号: 5, 页码: 531-540 作者:  Han, Yinhe;  Hu, Yu;  Li, Xiaowei;  Li, Huawei;  Chandra, Anshuman 收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16 automatic test equipment (ATE)  Godson processor  MUX network  test stimulus decompression