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PSI Conscious Write Scheduling: Architectural Support for Reliable Power Delivery in 3-D Die-Stacked PCM 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 5, 页码: 1613-1625
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Zhang, Lei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载：53/0  |  提交时间：2019/12/13
3-D integration  IR-drop  phase-change memory (PCM)  through-silicon-via (TSV)  write throughput  
Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：67/0  |  提交时间：2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing