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MRFI: An Open-Source Multiresolution Fault Injection Framework for Neural Network Processing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 页码: 11
作者:  Huang, Haitong;  Liu, Cheng;  Xue, Xinghua;  Liu, Bo;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:3/0  |  提交时间:2024/05/20
Biological neural networks  Hardware  Reliability  Computational modeling  Neural networks  Fault tolerant systems  Fault tolerance  Fault evaluation  fault injection  fault simulation  multiresolution  neural network reliability  
Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 1, 页码: 159-172
作者:  Yin, Xunzhao;  Chen, Xiaoming;  Niemier, Michael;  Hu, Xiaobo Sharon
收藏  |  浏览/下载:81/0  |  提交时间:2019/04/03
Ferroelectric FET (FeFET)  logic-in-memory (LiM)  nonvolatile (NV) memory  
A Flexible Divide-and-Conquer MPSoC Architecture for MIMO Interference Cancellation 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 10, 页码: 2789-2802
作者:  Yuan, Luechao;  Liu, Cang;  Tang, Chuan;  Huang, Shan;  Chattopadhyay, Anupam;  Ascheid, Gerd;  Xing, Zuocheng
收藏  |  浏览/下载:38/0  |  提交时间:2019/12/12
Interference cancellation (IC)  matrix inversion  multiprocessor system-on-chip(MPSoC)  parallel processing  Tomlinson-Harashimaprecoding(THP)  
Going Cooler With Timing-Constrained TeSHoP: A Temperature Sensing-Based Hotspot-Driven Placement Technique for FPGAs 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 9, 页码: 2525-2537
作者:  Lu, Weina;  Hu, Yu;  Ye, Jing;  Li, Xiaowei
收藏  |  浏览/下载:39/0  |  提交时间:2019/12/12
Computer-aided design flow  field-programmable gate arrays (FPGAs)  hotspot optimization  performance  
PSI Conscious Write Scheduling: Architectural Support for Reliable Power Delivery in 3-D Die-Stacked PCM 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 卷号: 24, 期号: 5, 页码: 1613-1625
作者:  Wang, Ying;  Han, Yinhe;  Li, Huawei;  Zhang, Lei;  Cheng, Yuanqing;  Li, Xiaowei
收藏  |  浏览/下载:53/0  |  提交时间:2019/12/13
3-D integration  IR-drop  phase-change memory (PCM)  through-silicon-via (TSV)  write throughput