Institute of Computing Technology, Chinese Academy IR
LAPS: Layout-Aware Path Selection for Post-Silicon Timing Characterization | |
Hu, Yu1,2; Ye, Jing2; Shi, Zhiping1,3; Li, Xiaowei2 | |
2017-02-01 | |
发表期刊 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS |
ISSN | 1745-1361 |
卷号 | E100D期号:2页码:323-331 |
摘要 | Process variation has become prominent in the advanced CMOS technology, making the timing of fabricated circuits more uncertain. In this paper, we propose a Layout-Aware Path Selection (LAPS) technique to accurately estimate the circuit timing variation from a small set of paths. Three features of paths are considered during the path selection. Experiments conducted on benchmark circuits with process variation simulated with VARIUS show that, by selecting only hundreds of paths, the fitting errors of timing distribution are kept below 5.3% when both spatial correlated and spatial uncorrelated process variations exist. |
关键词 | process variation timing variation sample path selection least square |
DOI | 10.1587/transinf.2016EDP7184 |
收录类别 | SCI |
语种 | 英语 |
资助项目 | National Natural Science Foundation of China (NSFC)[61532017] ; National Natural Science Foundation of China (NSFC)[61376043] ; National Natural Science Foundation of China (NSFC)[61274030] |
WOS研究方向 | Computer Science |
WOS类目 | Computer Science, Information Systems ; Computer Science, Software Engineering |
WOS记录号 | WOS:000399370700009 |
出版者 | IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://119.78.100.204/handle/2XEOYT63/7286 |
专题 | 中国科学院计算技术研究所期刊论文_英文 |
通讯作者 | Shi, Zhiping |
作者单位 | 1.Capital Normal Univ, Beijing Adv Innovat Ctr Imaging Technol, Beijing 100048, Peoples R China 2.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China 3.Capital Normal Univ, Coll Informat Engn, Beijing 100048, Peoples R China |
推荐引用方式 GB/T 7714 | Hu, Yu,Ye, Jing,Shi, Zhiping,et al. LAPS: Layout-Aware Path Selection for Post-Silicon Timing Characterization[J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,2017,E100D(2):323-331. |
APA | Hu, Yu,Ye, Jing,Shi, Zhiping,&Li, Xiaowei.(2017).LAPS: Layout-Aware Path Selection for Post-Silicon Timing Characterization.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,E100D(2),323-331. |
MLA | Hu, Yu,et al."LAPS: Layout-Aware Path Selection for Post-Silicon Timing Characterization".IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E100D.2(2017):323-331. |
条目包含的文件 | 条目无相关文件。 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论