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LAPS: Layout-Aware Path Selection for Post-Silicon Timing Characterization
Hu, Yu1,2; Ye, Jing2; Shi, Zhiping1,3; Li, Xiaowei2
2017-02-01
发表期刊IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
ISSN1745-1361
卷号E100D期号:2页码:323-331
摘要Process variation has become prominent in the advanced CMOS technology, making the timing of fabricated circuits more uncertain. In this paper, we propose a Layout-Aware Path Selection (LAPS) technique to accurately estimate the circuit timing variation from a small set of paths. Three features of paths are considered during the path selection. Experiments conducted on benchmark circuits with process variation simulated with VARIUS show that, by selecting only hundreds of paths, the fitting errors of timing distribution are kept below 5.3% when both spatial correlated and spatial uncorrelated process variations exist.
关键词process variation timing variation sample path selection least square
DOI10.1587/transinf.2016EDP7184
收录类别SCI
语种英语
资助项目National Natural Science Foundation of China (NSFC)[61532017] ; National Natural Science Foundation of China (NSFC)[61376043] ; National Natural Science Foundation of China (NSFC)[61274030]
WOS研究方向Computer Science
WOS类目Computer Science, Information Systems ; Computer Science, Software Engineering
WOS记录号WOS:000399370700009
出版者IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
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被引频次:4[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://119.78.100.204/handle/2XEOYT63/7286
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Shi, Zhiping
作者单位1.Capital Normal Univ, Beijing Adv Innovat Ctr Imaging Technol, Beijing 100048, Peoples R China
2.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
3.Capital Normal Univ, Coll Informat Engn, Beijing 100048, Peoples R China
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Hu, Yu,Ye, Jing,Shi, Zhiping,et al. LAPS: Layout-Aware Path Selection for Post-Silicon Timing Characterization[J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,2017,E100D(2):323-331.
APA Hu, Yu,Ye, Jing,Shi, Zhiping,&Li, Xiaowei.(2017).LAPS: Layout-Aware Path Selection for Post-Silicon Timing Characterization.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,E100D(2),323-331.
MLA Hu, Yu,et al."LAPS: Layout-Aware Path Selection for Post-Silicon Timing Characterization".IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E100D.2(2017):323-331.
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