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RARE: An Efficient Static Fault Detection Framework for Definition-Use Faults in Large Programs
Zhong, Lujie1; Yew, Pen-Chung2; Huo, Wei3; Li, Feng3; Feng, Xiaobing4; Zhang, Zhaoqing4
2018
发表期刊IEEE ACCESS
ISSN2169-3536
卷号6页码:10432-10444
摘要A range-reduced static definition-use (def-use) fault detection framework is proposed to improve the scalability, but still retain its accuracy, when applied to large application programs. It casts common faults, such as null pointer dereferences, undefined references, buffer overflows, and memory leaks into a common def-use fault pattern, and uses a two-level path-insensitive approach to classify variable uses that can trigger faults into must-trigger, must-not-trigger, and may-trigger categories depending on whether the unsafe uses can actually be, never be, or may be executed. For those must-trigger unsafe uses, faults are immediately reported, and those must-not-trigger uses are dropped from further analysis. The already reduced program range that is relevant to the may-trigger unsafe uses is further reduced by using a binary decision diagram encoded path extraction scheme for more accurate, but more expensive, path-sensitive analysis. A prototype has been built using this approach, and a set of large realistic applications (a total of more than 4.8 MLOC) was tested for such common types of def-use faults. Compared with existing popular path-sensitive detection tools such as Clang Static Analyzer, we find our approach incurs less analysis time, but achieves good accuracy with a low false positive rate and no false negative.
关键词Accuracy fault detection scalability sensitivity software reliability
DOI10.1109/ACCESS.2018.2797314
收录类别SCI
语种英语
资助项目National Natural Science Foundation of China[61402303] ; Project of Beijing Municipal Commission of Education[KM201510028016]
WOS研究方向Computer Science ; Engineering ; Telecommunications
WOS类目Computer Science, Information Systems ; Engineering, Electrical & Electronic ; Telecommunications
WOS记录号WOS:000427896200001
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计
文献类型期刊论文
条目标识符http://119.78.100.204/handle/2XEOYT63/5692
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Zhong, Lujie
作者单位1.Capital Normal Univ, Informat Engn Coll, Beijing 100048, Peoples R China
2.Univ Minnesota Twin Cities, Dept Comp Sci & Engn, Minneapolis, MN 55455 USA
3.Chinese Acad Sci, Inst Informat Engn, Res Lab 6, Beijing 100093, Peoples R China
4.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
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GB/T 7714
Zhong, Lujie,Yew, Pen-Chung,Huo, Wei,et al. RARE: An Efficient Static Fault Detection Framework for Definition-Use Faults in Large Programs[J]. IEEE ACCESS,2018,6:10432-10444.
APA Zhong, Lujie,Yew, Pen-Chung,Huo, Wei,Li, Feng,Feng, Xiaobing,&Zhang, Zhaoqing.(2018).RARE: An Efficient Static Fault Detection Framework for Definition-Use Faults in Large Programs.IEEE ACCESS,6,10432-10444.
MLA Zhong, Lujie,et al."RARE: An Efficient Static Fault Detection Framework for Definition-Use Faults in Large Programs".IEEE ACCESS 6(2018):10432-10444.
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