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Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback
Wang, Wentao1; Gupta, Arushi1; Niu, Nan1; Da Xu, Li2; Cheng, Jing-Ru C.3; Niu, Zhendong4
2018
发表期刊IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
ISSN1551-3203
卷号14期号:1页码:342-349
摘要In many critical industrial information systems, tracking a dependability requirement is instrumental to the verification and validation (V&V) of security, privacy, and other dependability concerns. Automated traceability tools employ information retrieval methods to recover candidate links, which saves much manual effort. Integrating relevance feedback (RF) could potentially improve the retrieval effectiveness by soliciting the relevance judgments on a subset of the retrieval results and then incorporating the feedback into subsequent retrieval. However, little is known about how to use RF to trace dependability requirements. In this paper, we propose a novel term-based RF algorithm that leverages the term usage context to recommend positive and negative feedback. Experiments on two software datasets show that our algorithm significantly outperforms the contemporary link-based RF tracing method. Our work not only contributes a new solution to dependability requirements' V&V, but also enables further automation to reduce the manual effort in the development life cycle of dependable industrial systems.
关键词Dependability dependability requirements privacy requirements tracing relevance feedback (RF) security
DOI10.1109/TII.2016.2637166
收录类别SCI
语种英语
资助项目U.S. National Science Foundation[CCF 1350487] ; National Natural Science Foundation of China[61375053]
WOS研究方向Automation & Control Systems ; Computer Science ; Engineering
WOS类目Automation & Control Systems ; Computer Science, Interdisciplinary Applications ; Engineering, Industrial
WOS记录号WOS:000422661900034
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计
被引频次:28[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://119.78.100.204/handle/2XEOYT63/5568
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Niu, Nan
作者单位1.Univ Cincinnati, Dept Elect Engn & Comp Syst, Cincinnati, OH 45221 USA
2.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China
3.US Army Engineer Res & Dev Ctr, Informat Technol Lab, Vicksburg, MS 39180 USA
4.Beijing Inst Technol, Sch Comp Sci & Technol, Beijing 100081, Peoples R China
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Wang, Wentao,Gupta, Arushi,Niu, Nan,et al. Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback[J]. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,2018,14(1):342-349.
APA Wang, Wentao,Gupta, Arushi,Niu, Nan,Da Xu, Li,Cheng, Jing-Ru C.,&Niu, Zhendong.(2018).Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback.IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,14(1),342-349.
MLA Wang, Wentao,et al."Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback".IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS 14.1(2018):342-349.
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