Institute of Computing Technology, Chinese Academy IR
Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback | |
Wang, Wentao1; Gupta, Arushi1; Niu, Nan1; Da Xu, Li2; Cheng, Jing-Ru C.3; Niu, Zhendong4 | |
2018 | |
发表期刊 | IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS |
ISSN | 1551-3203 |
卷号 | 14期号:1页码:342-349 |
摘要 | In many critical industrial information systems, tracking a dependability requirement is instrumental to the verification and validation (V&V) of security, privacy, and other dependability concerns. Automated traceability tools employ information retrieval methods to recover candidate links, which saves much manual effort. Integrating relevance feedback (RF) could potentially improve the retrieval effectiveness by soliciting the relevance judgments on a subset of the retrieval results and then incorporating the feedback into subsequent retrieval. However, little is known about how to use RF to trace dependability requirements. In this paper, we propose a novel term-based RF algorithm that leverages the term usage context to recommend positive and negative feedback. Experiments on two software datasets show that our algorithm significantly outperforms the contemporary link-based RF tracing method. Our work not only contributes a new solution to dependability requirements' V&V, but also enables further automation to reduce the manual effort in the development life cycle of dependable industrial systems. |
关键词 | Dependability dependability requirements privacy requirements tracing relevance feedback (RF) security |
DOI | 10.1109/TII.2016.2637166 |
收录类别 | SCI |
语种 | 英语 |
资助项目 | U.S. National Science Foundation[CCF 1350487] ; National Natural Science Foundation of China[61375053] |
WOS研究方向 | Automation & Control Systems ; Computer Science ; Engineering |
WOS类目 | Automation & Control Systems ; Computer Science, Interdisciplinary Applications ; Engineering, Industrial |
WOS记录号 | WOS:000422661900034 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://119.78.100.204/handle/2XEOYT63/5568 |
专题 | 中国科学院计算技术研究所期刊论文_英文 |
通讯作者 | Niu, Nan |
作者单位 | 1.Univ Cincinnati, Dept Elect Engn & Comp Syst, Cincinnati, OH 45221 USA 2.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China 3.US Army Engineer Res & Dev Ctr, Informat Technol Lab, Vicksburg, MS 39180 USA 4.Beijing Inst Technol, Sch Comp Sci & Technol, Beijing 100081, Peoples R China |
推荐引用方式 GB/T 7714 | Wang, Wentao,Gupta, Arushi,Niu, Nan,et al. Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback[J]. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,2018,14(1):342-349. |
APA | Wang, Wentao,Gupta, Arushi,Niu, Nan,Da Xu, Li,Cheng, Jing-Ru C.,&Niu, Zhendong.(2018).Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback.IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS,14(1),342-349. |
MLA | Wang, Wentao,et al."Automatically Tracing Dependability Requirements via Term-Based Relevance Feedback".IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS 14.1(2018):342-349. |
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