A FUNCTIONAL TESTING METHOD FOR MICROPROCESSORS

	A FUNCTIONAL TESTING METHOD FOR MICROPROCESSORS
	SHEN, L ; SU, SYH
	1988-10-01
发表期刊	IEEE TRANSACTIONS ON COMPUTERS
ISSN	0018-9340
卷号	37 期号:10 页码:1288-1293
收录类别	SCI
语种	英语
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Engineering, Electrical & Electronic
WOS记录号	WOS:A1988Q294200015
出版者	IEEE COMPUTER SOC
引用统计	被引频次：9[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/5383
专题	中国科学院计算技术研究所期刊论文_英文
作者单位	1.SUNY BINGHAMTON,WATSON SCH ENGN,DEPT COMP,BINGHAMTON,NY 13901 2.CHINESE ACAD SCI,INST COMP TECHNOL,BEIJING,PEOPLES R CHINA
推荐引用方式 GB/T 7714	SHEN, L,SU, SYH. A FUNCTIONAL TESTING METHOD FOR MICROPROCESSORS[J]. IEEE TRANSACTIONS ON COMPUTERS,1988,37(10):1288-1293.
APA	SHEN, L,&SU, SYH.(1988).A FUNCTIONAL TESTING METHOD FOR MICROPROCESSORS.IEEE TRANSACTIONS ON COMPUTERS,37(10),1288-1293.
MLA	SHEN, L,et al."A FUNCTIONAL TESTING METHOD FOR MICROPROCESSORS".IEEE TRANSACTIONS ON COMPUTERS 37.10(1988):1288-1293.