I-DDT: Fundamentals and test generation

	I-DDT: Fundamentals and test generation
	Kuang, JS ; You, ZQ ; Zhu, QJ ; Min, YH
	2003-05-01
发表期刊	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
ISSN	1000-9000
卷号	18 期号:3 页码:299-307
摘要	It is the time to explore the fundamentals Of I-DDT testing when extensive work has been done for I-DDT testing since it was proposed; This paper precisely defines the concept of average transient current (I-DDT) of CMOS digital ICs, and experimentally analyzes the feasibility Of I-DDT test generation at gate level. Based on the SPICE simulation results, the paper suggests a formula to calculate I-DDT by means of counting only logical up-transitions, which enables I-DDT test generation at logic level. The Bayesian optimization algorithm is utilized for I-DDT test generation. Experimental results show that about 25% stuck-open faults are with I-DDT testability larger than 2.5, and likely to be I-DDT testable. It is also found that Most I-DDT testable faults are located near the primary inputs of a circuit under test. I-DDT test generation does not require fault sensitization procedure compared with stuck-at fault test generation. Furthermore, some redundant stuck-at faults can be detected by using I-DDT testing.
关键词	I-DDT testing logical transition hazard stuck-open fault
收录类别	SCI
语种	英语
WOS研究方向	Computer Science
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Software Engineering
WOS记录号	WOS:000183210500004
出版者	SCIENCE CHINA PRESS
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/13728
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Kuang, JS
作者单位	1.Hunan Univ, Coll Comp & Commun, Changsha 410082, Peoples R China 2.Chinese Acad Sci, Inst Comp Technol, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Kuang, JS,You, ZQ,Zhu, QJ,et al. I-DDT: Fundamentals and test generation[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2003,18(3):299-307.
APA	Kuang, JS,You, ZQ,Zhu, QJ,&Min, YH.(2003).I-DDT: Fundamentals and test generation.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,18(3),299-307.
MLA	Kuang, JS,et al."I-DDT: Fundamentals and test generation".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 18.3(2003):299-307.