I-DDT testing versus I-DDQ testing

	I-DDT testing versus I-DDQ testing
	Min, YH; Li, ZC
	1998-08-01
发表期刊	JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN	0923-8174
卷号	13 期号:1 页码:51-55
摘要	I-DDQ testing has progressed to become a worldwide accepted test method to detect CMOS IC defects. However, it is noticed that observing the average transient current can lead to improvements in real defect coverage, which is referred to I-DDT testing. This letter presents a formal procedure to identify I-DDT testable faults, and to generate input vector pairs to detect the faults based on Boolean process. It is interesting to note that those faults may not be detected by I-DDQ or other test methods, which shows the significance of I-DDT testing.
关键词	I-DDQ test Boolean process stuck-open fault I-DDT test
收录类别	SCI
语种	英语
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000077635800006
出版者	KLUWER ACADEMIC PUBL
引用统计	被引频次：12[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/13277
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Min, YH
作者单位	Chinese Acad Sci, Comp Technol Inst, CAD Lab, Ctr Fault Tolerant Comp, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Min, YH,Li, ZC. I-DDT testing versus I-DDQ testing[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,1998,13(1):51-55.
APA	Min, YH,&Li, ZC.(1998).I-DDT testing versus I-DDQ testing.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,13(1),51-55.
MLA	Min, YH,et al."I-DDT testing versus I-DDQ testing".JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 13.1(1998):51-55.