A Novel Post-Silicon Debug Mechanism Based on Suspect Window

doi:10.1587/transinf.E93.D.1175

	A Novel Post-Silicon Debug Mechanism Based on Suspect Window
	Jianliang Gao 1,2; Yinhe Han 1,2; Xiaowei Li 1,2
	2010-05-01
发表期刊	IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
ISSN	0916-8532
卷号	E93D 期号:5 页码:1175-1185
摘要	Bugs are becoming unavoidable in complex integrated circuit design. It is imperative to identify the bugs as soon as possible through post-silicon debug. For post-silicon debug, observability is one of the biggest challenges. Scan-based debug mechanism provides high observability by reusing scan chains. However, it is not feasible to scan dump cycle-by-cycle during program execution due to the excessive time required. In fact, it is not necessary to scan out the error-free states. In this paper, we introduce Suspect Window to cover the clock cycle in which the bug is triggered. Then, we present an efficient approach to determine the suspect window. Based on Suspect Window, we propose a novel debug mechanism to locate the bug both temporally and spatially. Since scan dumps are only taken in the suspect window with the proposed mechanism, the time required for locating the bug is greatly reduced. The approaches are evaluated using ISCAS'89 and ITC'99 benchmark circuits. The experimental results show that the proposed mechanism can significantly reduce the overall debug time compared to scan-based debug mechanism while keeping high observability.
关键词	debug scan dump real-time trace suspect window
DOI	10.1587/transinf.E93.D.1175
收录类别	SCI
语种	英语
WOS研究方向	Computer Science
WOS类目	Computer Science, Information Systems ; Computer Science, Software Engineering
WOS记录号	WOS:000279136500026
出版者	IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
引用统计
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/12002
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Jianliang Gao
作者单位	1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing, Peoples R China 2.Chinese Acad Sci, Grad Univ, Beijing, Peoples R China
推荐引用方式 GB/T 7714	Jianliang Gao,Yinhe Han,Xiaowei Li. A Novel Post-Silicon Debug Mechanism Based on Suspect Window[J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,2010,E93D(5):1175-1185.
APA	Jianliang Gao,Yinhe Han,&Xiaowei Li.(2010).A Novel Post-Silicon Debug Mechanism Based on Suspect Window.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,E93D(5),1175-1185.
MLA	Jianliang Gao,et al."A Novel Post-Silicon Debug Mechanism Based on Suspect Window".IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E93D.5(2010):1175-1185.