Measuring and analyzing available bandwidth on the Internet

	Measuring and analyzing available bandwidth on the Internet
	Liu, M ; Li, ZC
	2006
发表期刊	CHINESE JOURNAL OF ELECTRONICS
ISSN	1022-4653
卷号	15 期号:1 页码:27-31
摘要	Available bandwidth (avail-bw for short) is a crucial metric in capacity provisioning, routing and QoS verification. However, existing tools failed to estimate it accurately and could not measure bandwidth beyond the source node's maximum sending rate. In this paper, we redefine the avail-bw based on link idle ratio. Then we analyze the effect of the routing of cross traffic packets on avail-bw measurement and present a novel approach, Idlerate, to measure end-to-end avail-bw for one path. Idlerate is fundamentally different in the basic idea from previous methods and sends small single packet randomly instead of sending packet pair/train back-to-back. Unlike methodologies based on packet dispersion, which are limited by the maximum sending rate of the sender, Idlerate could work on network whose capacity is far beyond the maximum sending rate of the sender. We have evaluated its accuracy and efficiency in simulations and compared its performance with current bandwidth estimation tools.
关键词	network measurements available bandwidth capacity bottleneck bandwidth
收录类别	SCI
语种	英语
WOS研究方向	Engineering
WOS类目	Engineering, Electrical & Electronic
WOS记录号	WOS:000234869900006
出版者	TECHNOLOGY EXCHANGE LIMITED HONG KONG
引用统计
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/10691
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Liu, M
作者单位	1.Chinese Acad Sci, Inst Comp Technol, Beijing 100080, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China
推荐引用方式 GB/T 7714	Liu, M,Li, ZC. Measuring and analyzing available bandwidth on the Internet[J]. CHINESE JOURNAL OF ELECTRONICS,2006,15(1):27-31.
APA	Liu, M,&Li, ZC.(2006).Measuring and analyzing available bandwidth on the Internet.CHINESE JOURNAL OF ELECTRONICS,15(1),27-31.
MLA	Liu, M,et al."Measuring and analyzing available bandwidth on the Internet".CHINESE JOURNAL OF ELECTRONICS 15.1(2006):27-31.