Test resource partitioning based on efficient response compaction for test time and tester channels reduction

	Test resource partitioning based on efficient response compaction for test time and tester channels reduction
	Han, YH ; Li, XW ; Li, HW ; Chandra, A
	2005-03-01
发表期刊	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
ISSN	1000-9000
卷号	20 期号:2 页码:201-209
摘要	This paper presents a test resource partitioning technique based on an efficient response compaction design called quotient compactor(q-Compactor). Because q-Compactor. is a single-output compactor, high compaction ratios can be obtained even for chips with a small number of outputs. Some theorems for the design of q-Compactor are presented to achieve full diagnostic ability, minimize error cancellation and handle unknown bits in the outputs of the circuit under test (CUT). The q-Compactor can also be moved to the load-board, so as to compact the output response of the CUT even during functional testing. Therefore, the number of tester channels required to test the chip is significantly reduced. The experimental results on the ISCAS '89 benchmark circuits and an MPEG 2 decoder SoC show that the proposed compaction scheme is very efficient.
关键词	system-on-a-chip (SoC) test resource partitioning (TRP) response compaction diagnose error cancellation
收录类别	SCI
语种	英语
WOS研究方向	Computer Science
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Software Engineering
WOS记录号	WOS:000227919000007
出版者	SCIENCE CHINA PRESS
引用统计	被引频次：3[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/10223
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Han, YH
作者单位	1.Chinese Acad Sci, Comp Technol Inst, Beijing 100080, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China 3.Synopsys Inc, Mountain View, CA 94043 USA
推荐引用方式 GB/T 7714	Han, YH,Li, XW,Li, HW,et al. Test resource partitioning based on efficient response compaction for test time and tester channels reduction[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2005,20(2):201-209.
APA	Han, YH,Li, XW,Li, HW,&Chandra, A.(2005).Test resource partitioning based on efficient response compaction for test time and tester channels reduction.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,20(2),201-209.
MLA	Han, YH,et al."Test resource partitioning based on efficient response compaction for test time and tester channels reduction".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 20.2(2005):201-209.