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Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:71/0  |  提交时间:2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing  
Low latency IP mobility management: protocol and analysis 期刊论文
EURASIP JOURNAL ON WIRELESS COMMUNICATIONS AND NETWORKING, 2011, 页码: 16
作者:  Liu, Min;  Guo, Xiaobing;  Zhou, Anfu;  Wang, Shengling;  Li, Zhongcheng;  Dutkiewicz, Eryk
收藏  |  浏览/下载:76/0  |  提交时间:2019/12/16