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Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 卷号: 15, 期号: 5, 页码: 531-540
作者:  Han, Yinhe;  Hu, Yu;  Li, Xiaowei;  Li, Huawei;  Chandra, Anshuman
收藏  |  浏览/下载:39/0  |  提交时间:2019/12/16
automatic test equipment (ATE)  Godson processor  MUX network  test stimulus decompression  
Autonomous semantic link networking model for the Knowledge Grid 期刊论文
CONCURRENCY AND COMPUTATION-PRACTICE & EXPERIENCE, 2007, 卷号: 19, 期号: 7, 页码: 1065-1085
作者:  Hai Zhuge
收藏  |  浏览/下载:39/0  |  提交时间:2019/12/16
analogy  knowledge grid  reasoning  semantic link network  semantic grid