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Going Cooler With Timing-Constrained TeSHoP: A Temperature Sensing-Based Hotspot-Driven Placement Technique for FPGAs 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 卷号: 25, 期号: 9, 页码: 2525-2537
作者:  Lu, Weina;  Hu, Yu;  Ye, Jing;  Li, Xiaowei
收藏  |  浏览/下载：39/0  |  提交时间：2019/12/12
Computer-aided design flow  field-programmable gate arrays (FPGAs)  hotspot optimization  performance  
X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092
作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16
At-speed scan-based testing  low-power testing  X-filling  
Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 卷号: 15, 期号: 5, 页码: 531-540
作者:  Han, Yinhe;  Hu, Yu;  Li, Xiaowei;  Li, Huawei;  Chandra, Anshuman
收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16
automatic test equipment (ATE)  Godson processor  MUX network  test stimulus decompression