CSpace

浏览/检索结果: 共5条,第1-5条 帮助

已选(0)清除 条数/页:   排序方式:
CPU-GPU Cooperative QoS Optimization of Personalized Digital Healthcare Using Machine Learning and Swarm Intelligence 期刊论文
IEEE-ACM TRANSACTIONS ON COMPUTATIONAL BIOLOGY AND BIOINFORMATICS, 2024, 卷号: 21, 期号: 4, 页码: 521-533
作者:  Cao, Kun;  Cui, Yangguang;  Li, Liying;  Zhou, Junlong;  Hu, Shiyan
收藏  |  浏览/下载:1/0  |  提交时间:2024/12/06
Electronic healthcare  Quality of service  Graphics processing units  Central Processing Unit  Reliability  Machine learning  Estimation  CPU-GPU MPSoCs  machine learning  lifetime reliability  personalized digital healthcare  swarm intelligence  
Long Live TIME: Improving Lifetime and Security for NVM-Based Training-in-Memory Systems 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 12, 页码: 4707-4720
作者:  Cai, Yi;  Lin, Yujun;  Xia, Lixue;  Chen, Xiaoming;  Han, Song;  Wang, Yu;  Yang, Huazhong
收藏  |  浏览/下载:46/0  |  提交时间:2021/12/01
Gradient sparsification  lifetime  neural networks  training-in-memory  wear-leveling  
Quick-and-Dirty: An Architecture for High-Performance Temporary Short Writes in MLC PCM 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2019, 卷号: 68, 期号: 9, 页码: 1365-1375
作者:  Zhang, Mingzhe;  Zhang, Lunkai;  Jiang, Lei;  Chong, Frederic T.;  Liu, Zhiyong
收藏  |  浏览/下载:83/0  |  提交时间:2019/12/10
MLC PCM  performance  lifetime  retention time  tradeoff  
ReviveNet: A Self-Adaptive Architecture for Improving Lifetime Reliability via Localized Timing Adaptation 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2011, 卷号: 60, 期号: 9, 页码: 1219-1232
作者:  Yan, Guihai;  Han, Yinhe;  Li, Xiaowei
收藏  |  浏览/下载:69/0  |  提交时间:2019/12/16
Lifetime reliability  self-adaptive  aging sensor  timing adaptation  NBTI  
Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:72/0  |  提交时间:2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing