中国科学院计算技术研究所机构知识库

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	Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains 期刊论文 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2011, 卷号: 30, 期号: 3, 页码: 455-463 作者:  Wu, Shianling;  Wang, Laung-Terng;  Wen, Xiaoqing;  Jiang, Zhigang;  Tan, Lang;  Zhang, Yu;  Hu, Yu;  Jone, Wen-Ben;  Hsiao, Michael S.;  Li, James Chien-Mo;  Huang, Jiun-Lang;  Yu, Lizhen 收藏  |  浏览/下载：68/0  |  提交时间：2019/12/16 Aligned launch-on-capture  at-speed scan testing  double-capture  hybrid launch-on-capture  launch-on-capture  one-hot launch-on-capture  staggered launch-on-capture
	X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092 作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei 收藏  |  浏览/下载：38/0  |  提交时间：2019/12/16 At-speed scan-based testing  low-power testing  X-filling