中国科学院计算技术研究所机构知识库(CSpace): 检索

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	X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092 作者: Li, Jia; Xu, Qiang; Hu, Yu; Li, Xiaowei 收藏 \| 浏览/下载：43/0 \| 提交时间：2019/12/16 At-speed scan-based testing low-power testing X-filling
	Selected Crosstalk Avoidance Code for Reliable Network-on-Chip 期刊论文 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2009, 卷号: 24, 期号: 6, 页码: 1074-1085 作者: Zhang, Ying; Li, Hua-Wei; Li, Xiao-Wei 收藏 \| 浏览/下载：46/0 \| 提交时间：2019/12/16 crosstalk avoidance codeword selection reliable network-on-chip single event upset

中国科学院计算技术研究所机构知识库