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X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 卷号: 18, 期号: 7, 页码: 1081-1092
作者:  Li, Jia;  Xu, Qiang;  Hu, Yu;  Li, Xiaowei
收藏  |  浏览/下载：41/0  |  提交时间：2019/12/16
At-speed scan-based testing  low-power testing  X-filling  
Selected Crosstalk Avoidance Code for Reliable Network-on-Chip 期刊论文
JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2009, 卷号: 24, 期号: 6, 页码: 1074-1085
作者:  Zhang, Ying;  Li, Hua-Wei;  Li, Xiao-Wei
收藏  |  浏览/下载：44/0  |  提交时间：2019/12/16
crosstalk avoidance  codeword selection  reliable network-on-chip  single event upset