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Statistical Modeling of Soft Error Influence on Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 11, 页码: 4152-4163
作者:  Huang, Haitong;  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Luo, Tao;  Cheng, Long;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：2/0  |  提交时间：2024/05/20
Fault analysis  fault simulation  neural network (NN) reliability  statistical fault modeling  
Scalable and Conflict-Free NTT Hardware Accelerator Design: Methodology, Proof, and Implementation 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1504-1517
作者:  Mu, Jianan;  Ren, Yi;  Wang, Wen;  Hu, Yizhong;  Chen, Shuai;  Chang, Chip-Hong;  Fan, Junfeng;  Ye, Jing;  Cao, Yuan;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：9/0  |  提交时间：2023/12/04
Memory access pattern  number theoretic transform (NTT)  post-quantum cryptography (PQC)  scalable hardware design