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Soft Error Reliability Analysis of Vision Transformers 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2023, 页码: 11
作者:  Xue, Xinghua;  Liu, Cheng;  Wang, Ying;  Yang, Bing;  Luo, Tao;  Zhang, Lei;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:7/0  |  提交时间:2023/12/04
ABFT  fault-tolerance  soft errors  vision transformers (ViTs)  vulnerability analysis  
Accelerating Deformable Convolution Networks with Dynamic and Irregular Memory Accesses 期刊论文
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2023, 卷号: 28, 期号: 4, 页码: 23
作者:  Chu, Cheng;  Liu, Cheng;  Xu, Dawen;  Wang, Ying;  Luo, Tao;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:7/0  |  提交时间:2023/12/04
Deformable convolution network  neural network accelerator  irregular memory access  runtime tile scheduling  
Network Pruning for Bit-Serial Accelerators 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1597-1609
作者:  Zhao, Xiandong;  Wang, Ying;  Liu, Cheng;  Shi, Cong;  Tu, Kaijie;  Zhang, Lei
收藏  |  浏览/下载:7/0  |  提交时间:2023/12/04
AI accelerators  neural networks (NNs)  NN compression  
Variation Enhanced Attacks Against RRAM-Based Neuromorphic Computing System 期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 5, 页码: 1588-1596
作者:  Lv, Hao;  Li, Bing;  Zhang, Lei;  Liu, Cheng;  Wang, Ying
收藏  |  浏览/下载:7/0  |  提交时间:2023/12/04
Security  Hardware  Neuromorphic engineering  Computational modeling  Circuit faults  Resistance  Immune system  Adversarial attack  fault injection attack  neuromorphic computing system (NCS)  processing in memory  reliability  resistive memory  
On-Line Fault Protection for ReRAM-Based Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2023, 卷号: 72, 期号: 2, 页码: 423-437
作者:  Li, Wen;  Wang, Ying;  Liu, Cheng;  He, Yintao;  Liu, Lian;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:14/0  |  提交时间:2023/07/12
Training  Fault detection  Computational modeling  Image edge detection  Memristors  Neural networks  Kernel  Deep neural network  hard fault  ReRAM  reliability  soft fault