CSpace

浏览/检索结果: 共2条,第1-2条 帮助

限定条件            
已选(0)清除 条数/页:   排序方式:
Statistical lifetime reliability optimization considering joint effect of process variation and aging 期刊论文
INTEGRATION-THE VLSI JOURNAL, 2011, 卷号: 44, 期号: 3, 页码: 185-191
作者:  Jin, Song;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:67/0  |  提交时间:2019/12/16
Lifetime reliability  Process variation  NBTI  Duty cycle  Gate sizing  
A New Multiple-Round Dimension-Order Routing for Networks-on-Chip 期刊论文
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2011, 卷号: E94D, 期号: 4, 页码: 809-821
作者:  Fu, Binzhang;  Han, Yinhe;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载:70/0  |  提交时间:2019/12/16
network-on-chip (NoC)  fault-tolerant routing  multiple round dimension-order routing  turn model