Institute of Computing Technology, Chinese Academy IR
分面浏览:资助项目 |
当前检索式 | ((ALL:defect-oriented testing)) |
限定条件 | ((收录类别:SCI) AND (作者:Han, Yinhe) AND (作者:You, Zhiqiang) AND (发表日期:2021) AND (资助项目:Guangdong Basic and Applied Basic Research Foundation[2019A1515110284]) AND (资助项目:Guangdong Key Research and Development Project of China[2018B010107003])) |