Institute of Computing Technology, Chinese Academy IR
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当前检索式 | ((ALL:Electrical defects)) |
限定条件 | ((出处:IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT) AND (资助项目:National Natural Science Foundation of China[62173197]) AND (文献类型:期刊论文) AND (专题:中国科学院计算技术研究所期刊论文)) |
Bin Fang 1 | Fang, Cheng 1 | Liu, Huaping 1 |
Long, Xingming 1 | Sun, Fuchun 1 | Zhang, Shixin 1 |