Institute of Computing Technology, Chinese Academy IR
分面浏览：作者 |
| 当前检索式 | ((ALL：defect-oriented testing)) |
| 限定条件 | ((出处：IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS) AND (作者：You, Zhiqiang) AND (资助项目：Guangdong Key Research and Development Project of China[2016KZDXM052]) AND (专题：中国科学院计算技术研究所期刊论文)) |
| Chakrabarty, Krishne 1 | Han, Yinhe 1 | Liu, Bosheng 1 |
| Liu, Peng 1 | Wu, Jigang 1 | You, Zhiqiang 1 |
