Design & test education in Asia

	Design & test education in Asia
	Das, DK ; Fujiwara, H ; Li, YA ; Min, YH ; Xu, SY ; Zorian, Y
	2004-07-01
发表期刊	IEEE DESIGN & TEST OF COMPUTERS
ISSN	0740-7475
卷号	21 期号:4 页码:331-338
收录类别	SCI
语种	英语
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Engineering, Electrical & Electronic
WOS记录号	WOS:000222762900009
出版者	IEEE COMPUTER SOC
引用统计
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/9904
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Das, DK
作者单位	1.Virage Log, Fremont, CA 94538 USA 2.Jadavpur Univ, Dept Comp Sci & Engn, Kolkata, India 3.Nara Inst Sci & Technol, Grad Sch Informat Sci, Dept Informat Proc, Nara, Japan 4.Chinese Acad Sci, Inst Comp Technol, Beijing, Peoples R China 5.Beijing Huahong IC Design Co, Beijing, Peoples R China 6.Shanghai Univ, Shanghai, Peoples R China 7.Shanghai Coll Sci & Technol, Shanghai, Peoples R China
推荐引用方式 GB/T 7714	Das, DK,Fujiwara, H,Li, YA,et al. Design & test education in Asia[J]. IEEE DESIGN & TEST OF COMPUTERS,2004,21(4):331-338.
APA	Das, DK,Fujiwara, H,Li, YA,Min, YH,Xu, SY,&Zorian, Y.(2004).Design & test education in Asia.IEEE DESIGN & TEST OF COMPUTERS,21(4),331-338.
MLA	Das, DK,et al."Design & test education in Asia".IEEE DESIGN & TEST OF COMPUTERS 21.4(2004):331-338.