CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition

doi:10.1109/TC.2015.2479619

	CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition
	Yan, Guihai; Sun, Faqiang; Li, Huawei; Li, Xiaowei
	2016-03-01
发表期刊	IEEE TRANSACTIONS ON COMPUTERS
ISSN	0018-9340
卷号	65 期号:3 页码:716-729
摘要	In field degradation of manycore processors poses a grand challenge to core management, largely because the degradation is hard to quantify. We propose a novel core-level degradation quantification scheme, CoreRank, to facilitate the management. We first develop a new degradation metric, called "healthy condition", to capture the implication of performance degradation of a core with specific degraded components. Then, we propose a performance sampling scheme by using micro-operation streams, called snippet, to statistically quantify cores' healthy condition. We find that similar snippets exhibit stable performance distribution, which makes them ideal micro-benchmarks to testify the core-level healthy conditions. We develop a hardware-implemented version of CoreRank based on bloom filter and hash table. Unlike the traditional "faulty" or "fault-free" judgement, CoreRank provides a key facility to make better use of those imperfect cores that suffered from various progressive aging mechanisms such as NBTI, HCI. Experimental results show that CoreRank successfully hides significant performance degradation of a defective manycore processor in which even more than half of the cores are salvaged from various defects.
关键词	Reliability heterogeneity healthy condition manycore processor
DOI	10.1109/TC.2015.2479619
收录类别	SCI
语种	英语
资助项目	National Basic Research Program of China (973)[2011CB302503] ; NSFC[61221062] ; NSFC[61376043] ; NSFC[61432017] ; NSFC[61572470] ; NSFC[61532017]
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Engineering, Electrical & Electronic
WOS记录号	WOS:000370729600005
出版者	IEEE COMPUTER SOC
引用统计	被引频次：6[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/8779
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Yan, Guihai; Sun, Faqiang; Li, Huawei; Li, Xiaowei
作者单位	Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Yan, Guihai,Sun, Faqiang,Li, Huawei,et al. CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition[J]. IEEE TRANSACTIONS ON COMPUTERS,2016,65(3):716-729.
APA	Yan, Guihai,Sun, Faqiang,Li, Huawei,&Li, Xiaowei.(2016).CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition.IEEE TRANSACTIONS ON COMPUTERS,65(3),716-729.
MLA	Yan, Guihai,et al."CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition".IEEE TRANSACTIONS ON COMPUTERS 65.3(2016):716-729.