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Electron tomography simulator with realistic 3D phantom for evaluation of acquisition, alignment and reconstruction methods
Wan, Xiaohua1,2; Katchalski, Tsvi2; Churas, Christopher2; Ghosh, Sreya2; Phan, Sebastien2; Lawrence, Albert2; Hao, Yu1; Zhou, Ziying1,5; Chen, Ruijuan2,6; Chen, Yu1; Zhang, Fa1; Ellisman, Mark H.2,3,4
2017-05-01
发表期刊JOURNAL OF STRUCTURAL BIOLOGY
ISSN1047-8477
卷号198期号:2页码:103-115
摘要Because of the significance of electron microscope tomography in the investigation of biological structure at nanometer scales, ongoing improvement efforts have been continuous over recent years. This is particularly true in the case of software developments. Nevertheless, verification of improvements delivered by new algorithms and software remains difficult. Current analysis tools do not provide adaptable and consistent methods for quality assessment. This is particularly true with images of biological samples, due to image complexity, variability, low contrast and noise. We report an electron tomography (ET) simulator with accurate ray optics modeling of image formation that includes curvilinear trajectories through the sample, warping of the sample and noise. As a demonstration of the utility of our approach, we have concentrated on providing verification of the class of reconstruction methods applicable to wide field images of stained plastic-embedded samples. Accordingly, we have also constructed digital phantoms derived from serial block face scanning electron microscope images. These phantoms are also easily modified to include alignment features to test alignment algorithms. The combination of more realistic phantoms with more faithful simulations facilitates objective comparison of acquisition parameters, alignment and reconstruction algorithms and their range of applicability. With proper phantoms, this approach can also be modified to include more complex optical models, including distance-dependent blurring and phase contrast functions, such as may occur in cryotomography. (C) 2017 Elsevier Inc. All rights reserved.
关键词Electron Microscope Tomography Simulator Tilt Series Reconstruction Tracking Alignment Block face Inversion Curvilinear Warping
DOI10.1016/j.jsb.2017.04.002
收录类别SCI
语种英语
资助项目International Community Foundation under the Sun Yat Sen Fund for international Cultural Exchange and Collaboration ; National Science Foundation of China[61232001] ; National Science Foundation of China[61472397] ; National Science Foundation of China[61672493] ; National Science Foundation of China[61502455] ; Special Program for Applied Research on Super Computation of the NSFC-Guangdong Joint Fund - phase two
WOS研究方向Biochemistry & Molecular Biology ; Biophysics ; Cell Biology
WOS类目Biochemistry & Molecular Biology ; Biophysics ; Cell Biology
WOS记录号WOS:000402026300005
出版者ACADEMIC PRESS INC ELSEVIER SCIENCE
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://119.78.100.204/handle/2XEOYT63/7212
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Lawrence, Albert
作者单位1.Chinese Acad Sci, Inst Comp Technol, Beijing, Peoples R China
2.Univ Calif San Diego, Natl Ctr Microscopy & Imaging Res, San Diego, CA 92103 USA
3.Univ Calif San Diego, Dept Neurosci, San Diego, CA 92103 USA
4.Univ Calif San Diego, Dept Bioengn, San Diego, CA 92103 USA
5.Beijing Inst Technol, Beijing, Peoples R China
6.Tianjin Polytech Univ, Sch Elect & Informat Engn, Tianjin, Peoples R China
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Wan, Xiaohua,Katchalski, Tsvi,Churas, Christopher,et al. Electron tomography simulator with realistic 3D phantom for evaluation of acquisition, alignment and reconstruction methods[J]. JOURNAL OF STRUCTURAL BIOLOGY,2017,198(2):103-115.
APA Wan, Xiaohua.,Katchalski, Tsvi.,Churas, Christopher.,Ghosh, Sreya.,Phan, Sebastien.,...&Ellisman, Mark H..(2017).Electron tomography simulator with realistic 3D phantom for evaluation of acquisition, alignment and reconstruction methods.JOURNAL OF STRUCTURAL BIOLOGY,198(2),103-115.
MLA Wan, Xiaohua,et al."Electron tomography simulator with realistic 3D phantom for evaluation of acquisition, alignment and reconstruction methods".JOURNAL OF STRUCTURAL BIOLOGY 198.2(2017):103-115.
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