Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug

doi:10.1109/TCAD.2018.2818690

	Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug
	Cheng, Yun 1,2; Li, Huawei 1,2; Wang, Ying 1,2; Li, Xiaowei 1,2
	2019-04-01
发表期刊	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
ISSN	0278-0070
卷号	38 期号:4 页码:767-779
摘要	Trace signal selection is of great importance for post-silicon debug. Debuggers traditionally use state restoration to improve the observability of the trace data, and state restoration ratio (SRR) is computed after state restoration. In this paper, we exploit the combination of snapshot states and trace states to improve the observability. First, we propose a novel state restoration method, called cluster restoration. It uses both the snapshot states of flip-flop clusters at the beginning of tracing, and the tracing states of the clusters' inputs during the tracing window to deterministically restore all states of these clusters during the tracing window. We also present a cluster restoration-based trace signal selection method to select clusters instead of trace signals directly, which includes two stages: 1) cluster generation and 2) cluster evaluation. For cluster generation, feedback loop-based cluster generation and backward tracing-based cluster generation techniques are proposed. For cluster evaluation, a new metric, called the global state restoration improvement is proposed to evaluate the candidate clusters. The experimental results show that in comparison to prior trace signal selection methods, our method can improve the SRR and reduce the runtime of trace signal selection as well.
关键词	Cluster generation post-silicon debug state restoration trace signal selection
DOI	10.1109/TCAD.2018.2818690
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61532017] ; National Natural Science Foundation of China[61504153] ; National Natural Science Foundation of China[61521092] ; National Key Research and Development Program of China[2016YFF0203500] ; IEEE VLSI Test Symposium
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Interdisciplinary Applications ; Engineering, Electrical & Electronic
WOS记录号	WOS:000462370000015
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计	被引频次：3[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/4162
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Li, Huawei
作者单位	1.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Cheng, Yun,Li, Huawei,Wang, Ying,et al. Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2019,38(4):767-779.
APA	Cheng, Yun,Li, Huawei,Wang, Ying,&Li, Xiaowei.(2019).Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,38(4),767-779.
MLA	Cheng, Yun,et al."Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 38.4(2019):767-779.