A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip

doi:10.1109/ACCESS.2020.2987928

	A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip
	Li, Hui 1; Liu, Feiyang 2; Gu, Huaxi 1; Chu, Zhuqin 1; Ye, Xiaochun 3
	2020
发表期刊	IEEE ACCESS
ISSN	2169-3536
卷号	8 页码:73457-73474
摘要	Silicon photonic interconnects on chip is an emerging technology for future ultra-scale and data-intensive computing chips, e.g., many-core processors, owing to its high transmission speed and low latency. However, in the Wavelength Division Multiplexing (WDM)-based architecture, the communication reliability can be significantly affected by the signal losses and crosstalk, due to the inherent characteristic of photonic devices. This paper studies the influence on reliability of managing application mapping and wavelength assignment separately. To deal with this issue, we propose a reliability-aware joint design method coordinating application mapping and wavelength assignment schemes. For a given application core graph and a network architecture, the design method can obtain a result of application mapping and wavelength assignment with improved reliability, compared to the separate scheme. According to the evaluation of Optical Signal-to-Noise Ratio (OSNR), the proposed method enables more reliable communication under given applications.
关键词	Wavelength assignment Reliability Photonics Crosstalk Optical device fabrication Silicon Optical crosstalk Silicon photonic interconnects on chip design method reliability application mapping wavelength assignment
DOI	10.1109/ACCESS.2020.2987928
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[61802290] ; National Natural Science Foundation of China[61634004] ; National Natural Science Foundation of China[61934002] ; National Key Research and Development Program of China[2018YFE0202800] ; Fundamental Research Funds for the Central Universities[XJS200101] ; HKKXJJ[2018ZC31002] ; Open Project Program of the State Key Laboratory of Mathematical Engineering and Advanced Computing[2019A01] ; State Key Laboratory of Computer Architecture[CARCH201707] ; Natural Science Foundation of Shaanxi Province for Distinguished Young Scholars[2020JC-26]
WOS研究方向	Computer Science ; Engineering ; Telecommunications
WOS类目	Computer Science, Information Systems ; Engineering, Electrical & Electronic ; Telecommunications
WOS记录号	WOS:000530830800003
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/15397
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Gu, Huaxi
作者单位	1.Xidian Univ, Sch Telecommun Engn, State Key Lab Integrated Serv Networks, Xian 710071, Peoples R China 2.AVIC, Xian Aeronaut Comp Tech Res Inst, Xian 710065, Peoples R China 3.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Li, Hui,Liu, Feiyang,Gu, Huaxi,et al. A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip[J]. IEEE ACCESS,2020,8:73457-73474.
APA	Li, Hui,Liu, Feiyang,Gu, Huaxi,Chu, Zhuqin,&Ye, Xiaochun.(2020).A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip.IEEE ACCESS,8,73457-73474.
MLA	Li, Hui,et al."A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip".IEEE ACCESS 8(2020):73457-73474.