Leakage current estimation of CMOS circuit with stack effect

	Leakage current estimation of CMOS circuit with stack effect
	Xu, YJ ; Luo, ZY ; Li, XW ; Li, LJ ; Hong, XL
	2004-09-01
发表期刊	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
ISSN	1000-9000
卷号	19 期号:5 页码:708-717
摘要	Leakage current of CMOS circuit increases dramatically with the technology scaling down and has become a critical issue of high performance system. Subthreshold, gate and reverse biased junction band-to-band tunneling (BTBT) leakages are considered three main determinants of total leakage current. Up to now, how to accurately estimate leakage current of large-scale circuits within endurable time remains unsolved, even though accurate leakage models have been widely discussed. In this paper, the authors first dip into the stack effect of CMOS technology and propose a new simple gate-level leakage current model. Then, a table-lookup based total leakage current simulator is built up according to the model. To validate the simulator, accurate leakage current is simulated at circuit level using popular simulator HSPICE for comparison. Some further studies such as maximum leakage current estimation, minimum leakage current generation and a high-level average leakage current macromodel are introduced in detail. Experiments on ISCAS85 and ISCAS89 benchmarks demonstrate that the two proposed leakage current estimation methods are very accurate and efficient.
关键词	computer-aided design leakage current estimation stack effect macromodeling propagation of signal probability
收录类别	SCI
语种	英语
WOS研究方向	Computer Science
WOS类目	Computer Science, Hardware & Architecture ; Computer Science, Software Engineering
WOS记录号	WOS:000224137200017
出版者	SCIENCE CHINA PRESS
引用统计	被引频次：4[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://119.78.100.204/handle/2XEOYT63/13833
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Xu, YJ
作者单位	1.Chinese Acad Sci, Inst Comp Technol, Beijing 100080, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China 3.Tsing Hua Univ, Dept Comp Sci & Technol, Beijing 100084, Peoples R China 4.Chinese Acad Sci, Inst Automat, Natl ASIC Design Engn Ctr, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Xu, YJ,Luo, ZY,Li, XW,et al. Leakage current estimation of CMOS circuit with stack effect[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2004,19(5):708-717.
APA	Xu, YJ,Luo, ZY,Li, XW,Li, LJ,&Hong, XL.(2004).Leakage current estimation of CMOS circuit with stack effect.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,19(5),708-717.
MLA	Xu, YJ,et al."Leakage current estimation of CMOS circuit with stack effect".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 19.5(2004):708-717.